This system can detect SLC, MLC, TLC, and QLC type flash memory, supporting multi-process NAND chips from 1xnm to 56nm (including 1xnm, 25nm, 34nm, 56nm) and compatible with ONFI and Toggle interfaces. Its packaging supports GA152 and BGA132 expansion types, enabling adaptation to components from numerous mainstream domestic and foreign manufacturers. Built with efficient testing algorithms and lifespan prediction functions, the system can accurately complete the full-process testing of failure analysis, grade sorting, and reliability evaluation, thereby meeting diverse testing needs and building the first line of defense for storage quality.